X-ray diffractometer
The Stresstech Xstress G2R enables users to measure residual stresses in the near-surface area.
Training period for independent usage, without pre knowledge: approx. 16 h
Profile
| The Stresstech Xstress G2R is an X-Ray diffractometer for the semi-automatic generation of surface residual stress profiles. | |
| MOS dector resolution | 0,03° - 0,06°/ pixel 2θ-angle |
| 2θ-Area | Adjustable between +100° and 165° |
| X-ray tube | Maximum exit: 30 kV at 10 mA = 300 watt |
| Collimator | Interchangeable, point siz: 1,2,3,4 und 5 mm |
| Measuring distance | Between 50, 75 and 100 mm |
| Software |
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